Problem: subrecipe cause lot abort
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Problem: subrecipe cause lot abort
名詞 COT:coater(涂膠) EXP:exposure(曝光) DEV:developer(顯影) REG:registration 、o...
納米(符號 nm,英式英文:nanometre、美式英文:nanometer,字首 nano 在希臘文中的原意是“侏儒”的意思),是一個長度單位...
Semiconductor metrology is a critical discipline in the production of hi...
What are coater/developers? In a process similar to creating photographi...
CLEAN TRACK LITHIUS Pro Z is TEL's most advanced 300mm process coater/de...
Roadmap The TWINSCAN NXT:1980Di Step-and-Scan system is a high-productiv...
The newest in the Applied Materials VeritySEM product family, VeritySEM ...
CD critical dimension 關(guān)鍵尺寸 SEM 掃描式電子顯微鏡(scanning electron microscope),簡稱...
專題公告
半導(dǎo)體工藝中的圖形轉(zhuǎn)移過程
從設(shè)計(jì)文件到電路實(shí)現(xiàn)的工藝框架
這是一個復(fù)雜的過程,要經(jīng)過工藝定義的各個相關(guān)部門的密切合作,在光刻定義的圖形基礎(chǔ)上,由Dry etch,wetprocess,diffusion,implant,thin film 等部門協(xié)同工作而完成實(shí)體電路的搭建.
簡單的電路實(shí)現(xiàn)要在Fab里流片十幾天,經(jīng)過十幾個光刻步驟,復(fù)雜的可能要幾十個步驟,所謂的cycle time(CT)則可能需要超過一個月甚至更多時(shí)間.
做過光刻的人可能都會對以下東西感興趣
CD:Cr...